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 FDP33N25 / FDPF33N25 250V N-Channel MOSFET
UniFET
FDP33N25 / FDPF33N25
250V N-Channel MOSFET
Features
* * * * * 33A, 250V, RDS(on) = 0.094 @VGS = 10 V Low gate charge ( typical 36.8 nC) Low Crss ( typical 39 pF) Fast switching Improved dv/dt capability
April 2007
TM
Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor correction.
D
G GDS
TO-220
FDP Series
GD S
TO-220F
FDPF Series
S
Absolute Maximum Ratings
Symbol
VDSS ID IDM VGSS EAS IAR EAR dv/dt PD TJ, TSTG TL Drain-Source Voltage Drain Current Drain Current Gate-Source voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Power Dissipation (TC = 25C) - Derate above 25C
(Note 2) (Note 1) (Note 1) (Note 3)
Parameter
- Continuous (TC = 25C) - Continuous (TC = 100C) - Pulsed
(Note 1)
FDP33N25
33 20.4 132
FDPF33N25
250 33* 20.4* 132*
Unit
V A A A V mJ A mJ V/ns
30 918 33 23.5 4.5 235 1.89 -55 to +150 300 37 0.29
W W/C C C
Operating and Storage Temperature Range Maximum Lead Temperature for Soldering Purpose, 1/8" from Case for 5 Seconds
*Drain current limited by maximum junction temperature
Thermal Characteristics
Symbol
RJC RCS RJA
Parameter
Thermal Resistance, Junction-to-Case Thermal Resistance, Case-to-Sink Typ. Thermal Resistance, Junction-to-Ambient
FDP33N25
0.53 0.5 62.5
FDPF33N25
3.4 -62.5
Unit
C/W C/W C/W
(c)2007 Fairchild Semiconductor Corporation
1
www.fairchildsemi.com
FDP33N25 / FDPF33N25 Rev. B
FDP33N25 / FDPF33N25 250V N-Channel MOSFET
Package Marking and Ordering Information
Device Marking
FDP33N25 FDPF33N25
Device
FDP33N25 FDPF33N25
Package
TO-220 TO-220F
TC = 25C unless otherwise noted
Reel Size
-
Tape Width
-
Quantity
50 50
Electrical Characteristics
Symbol
Off Characteristics BVDSS BVDSS / TJ IDSS IGSSF IGSSR VGS(th) RDS(on) gFS Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd IS ISM VSD trr Qrr
Notes:
Parameter
Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate-Body Leakage Current, Forward Gate-Body Leakage Current, Reverse Gate Threshold Voltage Static Drain-Source On-Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge
Conditions
VGS = 0V, ID = 250A, TJ = 25C ID = 250A, Referenced to 25C VDS = 250V, VGS = 0V VDS = 200V, TC = 125C VGS = 30V, VDS = 0V VGS = -30V, VDS = 0V VDS = VGS, ID = 250A VGS = 10V, ID = 16.5A VDS = 40V, ID = 16.5A VDS = 25V, VGS = 0V, f = 1.0MHz
(Note 4)
Min
250 -----3.0 ------
Typ
-0.25 -----0.077 26.6 1640 330 39 35 230 75 120 36.8 10 17 ---220 1.71
Max Units
--1 10 100 -100 5.0 0.094 -2135 430 59 80 470 160 250 48 --33 132 1.4 --V V/C A A nA nA V S pF pF pF ns ns ns ns nC nC nC A A V ns C
On Characteristics
Dynamic Characteristics
Switching Characteristics VDD = 125V, ID = 33A RG = 25
(Note 4, 5)
------(Note 4, 5)
VDS = 200V, ID = 33A VGS = 10V
------
Drain-Source Diode Characteristics and Maximum Ratings Maximum Continuous Drain-Source Diode Forward Current Maximum Pulsed Drain-Source Diode Forward Current Drain-Source Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS = 0V, IS = 33A VGS = 0V, IS = 33A dIF/dt =100A/s
(Note 4)
--
1. Repetitive Rating: Pulse width limited by maximum junction temperature 2. L = 1.35mH, IAS = 33A, VDD = 50V, RG = 25, Starting TJ = 25C 3. ISD 33A, di/dt 200A/s, VDD BVDSS, Starting TJ = 25C 4. Pulse Test: Pulse width 300s, Duty Cycle 2% 5. Essentially Independent of Operating Temperature Typical Characteristics
FDP33N25 / FDPF33N25 Rev. B
2
www.fairchildsemi.com
FDP33N25 / FDPF33N25 250V N-Channel MOSFET
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
10
2
VGS Top : 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5.5 V
10
2
ID, Drain Current [A]
10
1
ID, Drain Current [A]
10
1
150 C 25 C -55 C
* Notes : 1. VDS = 40V 2. 250s Pulse Test
o o
o
10
0
* Notes : 1. 250s Pulse Test 2. TC = 25 C
o
10
-1
10
0
10
1
10
0
2
4
6
8
10
12
VDS, Drain-Source Voltage [V]
VGS, Gate-Source Voltage [V]
Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperatue
0.25
10
2
RDS(ON) [], Drain-Source On-Resistance
VGS = 10V
0.15
IDR, Reverse Drain Current [A]
0.20
10
1
0.10
150 C 25 C
o
o
VGS = 20V
0.05
* Note : TJ = 25 C
o
* Notes : 1. VGS = 0V 2. 250s Pulse Test
0.00
0
20
40
60
80
100
10
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
ID, Drain Current [A]
VSD, Source-Drain voltage [V]
Figure 5. Capacitance Characteristics
4000
Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd
Figure 6. Gate Charge Characteristics
12
10
VDS = 50V VDS = 125V VDS = 200V
3000
Coss Ciss
VGS, Gate-Source Voltage [V]
8
Capacitances [pF]
2000
6
4
1000
Crss
* Note : 1. VGS = 0 V 2. f = 1 MHz
2
* Note : ID = 33A
0 -1 10
0
10
0
10
1
0
10
20
30
40
VDS, Drain-Source Voltage [V]
QG, Total Gate Charge [nC]
FDP33N25 / FDPF33N25 Rev. B
3
www.fairchildsemi.com
FDP33N25 / FDPF33N25 250V N-Channel MOSFET
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation vs. Temperature Figure 8. On-Resistance Variation vs. Temperature
3.0
1.2
BVDSS, (Normalized) Drain-Source Breakdown Voltage
1.1
RDS(ON), (Normalized) Drain-Source On-Resistance
2.5
2.0
1.0
1.5
1.0
* Notes : 1. VGS = 10 V 2. ID = 16.5 A
0.9
* Notes : 1. VGS = 0 V 2. ID = 250 A
0.5
0.8 -100
-50
0
50
100
o
150
200
0.0 -100
-50
0
50
100
o
150
200
TJ, Junction Temperature [ C]
TJ, Junction Temperature [ C]
Figure 9-1. Maximum Safe Operating Area for FDP33N25
Figure 9-2. Maximum Safe Operating Area for FDPF33N25
10
2
10 s 100 s 1 ms
10
2
10 s 100 s 1 ms
ID, Drain Current [A]
10
1
Operation in This Area is Limited by R DS(on)
DC
10 ms 100 ms
ID, Drain Current [A]
10
1
10 ms 100 ms
Operation in This Area is Limited by R DS(on)
DC
10
0
10
0
* Notes : o 1. TC = 25 C 2. TJ = 150 C 3. Single Pulse
o
* Notes : o 1. TC = 25 C 2. TJ = 150 C
o
10
-1
10
0
10
1
10
2
10
-1
3. Single Pulse
0
10
10
1
10
2
VDS, Drain-Source Voltage [V]
VDS, Drain-Source Voltage [V]
Figure 10. Maximum Drain Current vs. Case Temperature
40
30
ID, Drain Current [A]
20
10
0 25
50
75
100
o
125
150
TC, Case Temperature [ C]
FDP33N25 / FDPF33N25 Rev. B
4
www.fairchildsemi.com
FDP33N25 / FDPF33N25 250V N-Channel MOSFET
Typical Performance Characteristics (Continued)
Figure 11-1. Transient Thermal Response Curve for FDP33N25
10
0
ZJC(t), Thermal Response
D=0.5
10
-1
0.2 0.1 0.05 0.02 0.01 single pulse
PDM t1
* Notes : 1. Z JC(t) = 0.53 C/W Max. 2. Duty Factor, D=t1/t2 3. T JM - T C = PDM * Z JC(t)
o
t2
10
-2
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
t1, Square Wave Pulse Duration [sec]
Figure 11-2. Transient Thermal Response Curve for FDPF33N25
D=0.5
ZJC(t), Thermal Response
10
0
0.2 0.1 0.05
10
-1
PDM t1
* Notes : 1. Z JC (t) = 3.4 C/W Max. 2. Duty Factor, D=t1/t 2
o
0.02 0.01
t2
10
-2
single pulse
3. T JM - T C = P DM * Z JC (t)
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
t 1, Square W ave Pulse Duration [sec]
FDP33N25 / FDPF33N25 Rev. B
5
www.fairchildsemi.com
FDP33N25 / FDPF33N25 250V N-Channel MOSFET
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FDP33N25 / FDPF33N25 Rev. B
6
www.fairchildsemi.com
FDP33N25 / FDPF33N25 250V N-Channel MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FDP33N25 / FDPF33N25 Rev. B
7
www.fairchildsemi.com
FDP33N25 / FDPF33N25 250V N-Channel MOSFET
Mechanical Dimensions
TO-220
Dimensions in Millimeters
FDP33N25 / FDPF33N25 Rev. B
8
www.fairchildsemi.com
FDP33N25 / FDPF33N25 250V N-Channel MOSFET
Mechanical Dimensions
(Continued)
TO-220F
3.30 0.10 10.16 0.20 (7.00) o3.18 0.10 2.54 0.20 (0.70)
6.68 0.20
15.80 0.20
(1.00x45)
MAX1.47 9.75 0.30 0.80 0.10
(3 ) 0
0.35 0.10 2.54TYP [2.54 0.20]
#1 2.54TYP [2.54 0.20] 4.70 0.20
0.50 -0.05
+0.10
2.76 0.20
9.40 0.20
Dimensions in Millimeters
FDP33N25 / FDPF33N25 Rev. B
9
15.87 0.20
www.fairchildsemi.com
FDP33N25 / FDPF33N25 250V N-Channel MOSFET
tm
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx(R) Across the board. Around the world.TM ActiveArrayTM BottomlessTM Build it NowTM CoolFETTM CROSSVOLTTM CTLTM Current Transfer LogicTM DOMETM E2CMOSTM EcoSPARK(R) EnSignaTM FACT Quiet SeriesTM FACT(R) FAST(R) FASTrTM FPSTM FRFET(R) GlobalOptoisolatorTM GTOTM HiSeCTM i-LoTM ImpliedDisconnectTM IntelliMAXTM ISOPLANARTM MICROCOUPLERTM MicroPakTM MICROWIRETM Motion-SPMTM MSXTM MSXProTM OCXTM OCXProTM OPTOLOGIC(R) OPTOPLANAR(R) PACMANTM PDP-SPMTM POPTM Power220(R) Power247(R) PowerEdgeTM PowerSaverTM Power-SPMTM PowerTrench(R) Programmable Active DroopTM QFET(R) QSTM QT OptoelectronicsTM Quiet SeriesTM RapidConfigureTM RapidConnectTM ScalarPumpTM SMART STARTTM SPM(R) STEALTHTM SuperFETTM SuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 SyncFETTM TCMTM The Power Franchise(R)
TM
tm
TinyBoostTM TinyBuckTM TinyLogic(R) TINYOPTOTM TinyPowerTM TinyWireTM TruTranslationTM SerDesTM UHC(R) UniFETTM VCXTM WireTM
DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD'S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user.
PRODUCT STATUS DEFINITIONS Definition of Terms
2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
Datasheet Identification Advance Information Preliminary
Product Status Formative or In Design First Production
Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains specifications on a product that has been discontinued by Fairchild Semiconductor.The datasheet is printed for reference information only.
Rev. I26
No Identification Needed
Full Production
Obsolete
Not In Production
10 FDP33N25 / FDPF33N25 Rev. B
www.fairchildsemi.com


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